During the initial implant procedure, the left ventricular (lv) lead was unable to successfully connect to the header of the device.A replacement device was used, and the lv lead was successfully able to connect to the replacement device.The patient was in stable condition.
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As received, the device was at ddd mode above eri level.The device was then programed to nominal settings for the remainder of the analysis.The results of all electrical test performed, including mechanical stress testing and battery assessment indicate normal device characteristics.Longevity assessment was performed, and device was in the normal range of operation with appropriate remaining longevity.Analysis found no anomaly inserting and removing the leads from all the channels.The field complaint of failure to connect was not confirmed.
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