The reported event of inability to program was confirmed and found to be due to the device entering backup mode.Analysis of the device image found the device went into backup mode due to memory corruption.After the device was restored from backup mode, functional testing was performed.Telemetry, impedance, sensing, pacing and high voltage (hv) output functions of the device were tested and found to be normal.The backup operation could not be reproduced.The cause of the reported event could not be determined.
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