(b)(4).The device was manufactured on an unknown date in 1997.The device was returned for evaluation.A review of the device logs revealed no system errors, anomalies, hardware device failures or iipv events that could have caused or contributed to the reported difficulty.The product analysis lab (pal) evaluated the device and no failure or malfunction were identified that could have caused or contributed to the home patient passing away.The device passed both the homechoice rite (return instrument test/evaluation) electrical test and the homechoice rite functional test and was determined to meet performance specification requirements per rite testing.An internal and external inspection was performed and found no issues.Review of the device service history and device history record revealed no issues that could have caused or contributed to the home patient passing away.Should additional relevant information become available, a supplemental report will be submitted.
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