Secondary analysis found that the external pulse generator (epg) failed multiple tests related to ventricular output including ventricular current measurement, ventricular sensitivity, ventricular pulse amplitude and pulse width, and ventricular wave form integrity.Secondary analysis also noted that the device failed to generate ventricular pulse output and there was no v tip and v ring pacing.It was determined that the no ventricular output current pulse was found to be related to a bad current switching transistor.The transistor was replaced.The device passed all final functional tests.If information is provided in the future, a supplemental report will be issued.
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