The subject device was not returned to omsc.Omsc reviewed the device history record (dhr) of the subject device and confirmed no irregularity.The exact cause of the reported phenomenon could not be conclusively determined.However, based on the information from okr, there was the possibility that this phenomenon was attributed to the excessive force, or the chemical stress, or the poor storage environment (direct sunlight, high temperature, high humidity, environment exposed to x-rays / ultraviolet rays, etc.), or the aging deterioration.
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