Event problem and evaluation codes: updated.H10: device evaluation: the sample was returned for investigation.The sample was received in used condition without the original package.The sample was visually inspected, and a crack on the luer lock adapter was seen, which could possibly cause a leak.No other analysis was done.Based on the reported issue, arrived damaged- discovered upon opening, the allegation was confirmed, and analysis conducted in this investigation traced the root cause to supplier item fault.For corrective action, a notification of the complaint was submitted to production to be aware of the issue.Reported lot was manufactured before corrective actions were taken.A device history review summary stated that the lot met the requirements to release the lot with no deviations identified during their manufactured.An internal scar has been opened and this issue will be monitored for any increase in occurrence.If the occurrence of this issue increases significantly, additional corrective actions will be taken.This remediation mdr was generated under protocol (b)(4), as a result of warning letter cms# (b)(4).
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