The tip breaking condition (electrode) was confirmed only on one (1) of the returned units.The detached piece (electrode) was not returned with the unit.The probable root causes for the reported condition can be associated, but are not limited to: non-conforming component.According to the device history record review, the lot was manufactured according to specifications.Poor assembly process: in addition, a 30x inspection of the probe¿s tip assembly is performed on all the probes during manufacturing.The activation history could not be retrieved since the affected unit was returned with the communication cable cut.The activation history is stored in the e-prom chip located inside the connector of the communication cable, which was not returned for evaluation.However, according to the returned unit¿s visual inspection it is evident that the condition was observed after use during surgery.Misuse: the probe is delivered inside a blister in which the unit is snapped in place, and the blister is placed inside a box, which provides protection to the tip of the probe.In the event that the probe is delivered to the customer with a damaged tip, then the unit must be discarded before use.The product was returned for investigation and the reported failure mode was confirmed.The failure mode will be monitored for future reoccurrence. .
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