The returned ipg was analyzed and revealed that the device would not charge despite multiple attempts, and the internal electrical measurements confirmed an excessive sleep current and a low impedance measurement.The application specific integrated circuit asic chip was damaged.This type of damage is typically caused by the ipg exposure to high voltage or high current transients.The excessive current drawn from the damaged asic was caused utilizing plasma blade cautery and was an unintended use error that caused or contributed to the event.A product labeling review was conducted.This review determined that the following medical therapies or procedures may turn stimulation off, cause permanent damage to the stimulator, or may cause injury to the patient.If any of the procedures below is required by medical necessity, the procedures should be performed as far from the implanted components as possible.Stimulator function should be confirmed after the procedure.Ultimately, however, the stimulator may require explantation because of damage to the device or patient harm.Electrocautery can transfer destructive current into the dbs leads and or stimulator.Bipolar or monopolar electrocautery may be used.Electrocautery probes must be kept a minimum of 1 inch away from the implanted device.
|