The returned implantable pulse generator (ipg) was analyzed and revealed normal characteristics during visual inspection.However, a memory download revealed the log partially corrupted.Additionally, electrical testing revealed a high sleep current 7.1ma and low vh resistance measurement of 8.3 kilo-ohms indicative of exposure to high voltage sources causing an electrical short within the application specific integrated circuit (asic).A product labeling review identified that the device was used per the instructions for use (ifu), product label.Additionally, the ifu states that failure of malfunction of any device components or the battery including electrical shorts caused by electrocautery.Based on all the available information, engineers confirmed exposure to electrocautery can cause this damage and concluded that unintended use error caused of contributed to the event.
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