Upon receipt at our post market quality assurance laboratory, a thorough evaluation of the device was performed.Visual inspection noted tool marks on the case and header, and a small dent in the case front under the serial number, however no further anomalies were observed.A review of the device memory noted a reset, a long charge error, and a charge timeout error.An attempted commanded shock led to a charge timeout.The device case was removed and internal visual inspection noted a bubble on the dump flex.X-ray inspections noted burnt and damaged dump resistor traces in the bubble area.Resistance measurements from the dump resistor trace to the grounded shield noted 1.883 k ohms.This measurement should be open.The cause of the failure was the high voltage dump resistor being resistively connected to ground.This did not allow the high voltage capacitors to complete charging.Overall, analysis was able to confirm the allegation made against the device in the field.
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