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The subject device was returned to olympus (b)(4).However, the subject device was not returned to omsc, because it was a known phenomenon.Therefore, we conducted a survey based on the content of the proposal and the attached photo.It was confirmed that the probe was removed from the attached photo to the complaint information by olympus (b)(4).It is possible to infer the cause from the results of past similar investigations, therefore it was determined that an investigation using equipment with similar structure or similar device is unnecessary.The device history record for the serial number indicated no anomaly with the event-related items below.- [inspection] high-frequency output - [inspection] appearance the exact cause of the event couldn¿t be exclusively identified.However based on the past similar case, the probe broken was possibly occurred due to contact with a surgical instrument or the non-insulated area of grasping section.The detailed mechanisms are shown below. during output in seal & cut mode, the probe came in contact with hard tissue, metal or a surgical instrument.Consequently, a scratch was made on the probe.The probe received an output load in seal & cut mode or received a load when grasping tissue.As a result, the probe cracked from the scratch and the error occurred.The probe broke when added load. the distal end of the tissue pad was worn away because ¿seal & cut¿ output was activated while grasping nothing (including the case the user kept activating after cutting tissue).The tissue pad was worn away, causing the non-insulated of the grasping section to touch the probe.¿seal & cut¿ output was activated under this situation, then the scratches indicating that the probe and grasping section were in contact with each other were made.The probe received an output load in seal & cut mode or received a load when grasping tissue.As a result, the probe cracked from the scratch and the error occurred.The probe broke when added load.The above device handling has warned in the instruction manual.
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