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Additional information is provided in sections d.9,h.3,h.6 and h.10.A review of the device history record (dhr) traceable to the reported lot number indicates that the product was processed and released according to the product¿s acceptance criteria.The sample is received with inner blister, outer blister and cover foil showing the lot information.The sample shows macroscopic signs of damage.The silicon-tip is deformed.The sample shows no signs of surgery residues.The sample was visually inspected with the aid of a photomicroscope with various magnifications.The sample was visually inspected and functionally tested.It was noticed that the silicon-tip was deformed, and the aspiration was bad.As the blister was opened by the customer, he handled the product.The point in time when the malfunction occurred, can no longer be determent.It cannot be determined how or where the damage to the sample occurred; therefore a root cause for the customers reported event could not be determined.However, the damage was consistent with damage that can occur due to improper handling.The exact root cause for the customers reported event is unknown, therefore, specific action cannot be taken.The manufacturer internal reference number is: (b)(4).
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