This report is being supplemented to provide additional information based on the legal manufacturer's final investigation.Three attempts were performed to obtain additional information, but no response was received from the customer.The device history record was unable to be reviewed for this device since the lot number was not provided.However, olympus only releases products to market that meet all manufacturing specifications and final product release criteria.Based on the results of the investigation, and because the device was not returned, the phenomenon was not duplicated during device evaluation.Therefore, the root cause of the phenomenon could not be identified.Though the phenomenon was not confirmed during sampling inspection, possible causes for the dropout of maj-2315 are likely due to: chemicals such as anti-fogging agents adhered to the distal cover, and the rear end of the distal cover was damaged by chemical attack, making it easy to remove the cover from the endoscope, and /or the cover was easily removed from the scope due to insufficient attachment to the scope.Sampling inspection check was performed with results below: the parts supplier conducts sampling inspections of 3 parts for each production lot, and confirms that the parts conform to the specifications each time.Regarding the phenomenon, the instructions for use identify verbiage that could potentially prevent and detect the phenomenon: "please make sure that the distal cover is intact without any problem before installation, and it has no damage(crack) after installation.Also, do not use anti-fog agents as it is known that anti-fog agents will damage the cover." it was also noted there was a design change.We have verified that the distal cover does not come off from the distal end of the endoscope during procedure, and confirmed that the design change products satisfies the specifications.Based on the product code of the subject device of this report, the subject device is judged to be a product of the design change.Olympus will continue to monitor field performance for this device.
|