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This report is being supplemented to provide additional information based on the legal manufacturer's final investigation.Correction to d10 for information inadvertently left out of previous report.A review of the device history record found no deviations that could have caused or contributed to the reported issue.Replication testing was performed to determine if the insertion portion broke due to high stress.A force of 37.0n was applied to the electrode, which caused the insertion portion to break and the grasping section to detach.The state of breakage of the insertion portion was compared between the product used for replication testing and the complaint product.The results showed that both products broke at the seesaw pin position.Based on the results of the investigation and replication testing, force was applied to the distal end of the electrode during cleaning of the tissue pad using gauze.A definitive root cause cannot be identified.The event can be detected/prevented by following the instructions for use which state: - "should any crack, scratch, deformation, split, protrusion, or partial separating be observed on the probe tip, grasping section, tissue pad, insertion section, the surface of the transducer, transducer cord, or transducer plug, do not use them and replace the damaged instrument or the transducer with a spare.Using a damaged device may cause burns due to abnormal output or high-frequency (rf bipolar) current leakage or breakage of the probe tip, the tissue pad, and the grasping section." - "when cleaning the grasping section or the probe tip during treatment, wipe it with a soft object such as a piece of gauze or a brush if a body fluid or tissue gets burnt onto it.Do not attempt to scrape it with a hard object such as a scalpel or the tip of tweezers.Otherwise, the grasping section, the metal-exposed area around it, the tissue pad, a coated surface, or the probe tip may be scratched and damaged, which may lead to the damaged part falling off inside the body cavity." olympus will continue to monitor field performance for this device.
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