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This report is being supplemented to provide additional information based on the legal manufacturer's final investigation.A review of the device history record found no deviations that could have caused or contributed to the reported issue.It has been over 4 years since the subject device was manufactured.The device was returned to olympus for inspection, and the reportable malfunction was confirmed.Based on the results of the investigation, it is likely the following led to the malfunction: although we could not specify the cause of the event, it was possible that the event was caused by the following stress applied to the insertion section.Physical stress such as scratching and hitting at the insertion section.Chemical stress due to reprocessing outside of ifu (reprocessing manual) recommendations.Stress due to poor storage conditions (direct sunlight, high temperature, high humidity, x-rays, ultraviolet rays, etc.).Olympus will continue to monitor field performance for this device.
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