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This report is being supplemented to provide additional information based on the legal manufacturer's final investigation.A review of the device history record found no deviations that could have caused or contributed to the reported issue.The device was returned to olympus for inspection, and the reportable malfunction was confirmed.The definitive root cause was not identified; however, based on the results of the investigation, the probable cause is most likely that the probe was broken by the following mechanism: 1) activated output while the probe tip was contacted hard objects such as metal clips, stapler, or other instruments.This caused the probe tip scratched the endoscope.2) kept doing activated output in the state described in ¿1¿.This caused the probe tip to be applied a load, cracked due to the scratches on the probe tip.3) the probe was subjected to some kind of load and ruptured.The subject event can be detected and prevented by implementation in accordance with the below ifu.¿ the sonicbeat instrument should be used for soft tissue.Do not activate output while grasping hard tissue such as bone or highly calcified tissue, or hard objects such as metal clips, stapler, or other instruments (e.G., uterine manipulator, forceps, and others).Otherwise, it may cause the probe tip to be scratched or come into direct contact with the metal area of the grasping section as the heat generated by the friction between the hard object and the probe tip could cause wear/deforming/split/protruding/partial separating of the tissue pad.In turn, the probe may break before displaying an error window or generating an alarm tone.¿ do not grasp or let the probe tip contact hard objects such as metal clips, stapler, or other instruments (e.G., uterine manipulator).Also, be careful to avoid contacting the probe tip with those accidentally.Particularly during activation, a scratch on the probe tip could occur due to ultrasonic vibration, which leads the probe tip to break and fall off into the body cavity.Olympus will continue to monitor field performance for this device.
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