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Additional pro code selection that applies to the indication of this device - nhl.Device analysis performed on the returned implantable pulse generator (ipg) revealed communication could not be established with a known good remote control or clinician programmer.The data logs could not be retrieved or analyzed, and no functional testing could be performed.This damage is typically caused by the ipgs exposure to external high voltage or high current transient sources.A labeling review was performed.This review determined the following medical therapies or procedures may turn stimulation off or may cause permanent damage to the stimulator, particularly if used in close proximity to the device, this includes lithotripsy, electrocautery, external defibrillation, radiation therapy, ultrasonic scanning, and high output ultrasound and may require explantation as a result of damage to the device.Additionally, labeling states x-ray and ct scans may damage the stimulator if stimulation is on.It was confirmed through objective evidence that this ipg was electively explanted due to normal end-of-life (eol).There were no device issues prior to the eol and explant procedure.It was also confirmed from the field that the device was exposed to a computed tomography (ct) scan, and x-ray imaging before the device explantation; there were no device issues or device deficiencies following these imaging procedures.Technicians have confirmed through technical analysis of the ipg that communication could not be established with a known good rc or cp.The investigation confirmed that the asic chip was damaged.This type of damage is typically caused when the ipg is exposed to high voltage transients, high current sources, and high radio frequency (rf) energy.Per the physicians implant manual, labeling states x-ray and ct scans may damage the stimulator if stimulation is on.Therefore, based on objective evidence from the field and testing of the returned device, engineers concluded that the ipg was likely damaged unintentionally.
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