|
The event of unexpected mode switch was confirmed.The device was received in bvvi mode with battery voltage at elective replacement indicator (eri).Analysis performed found memory errors registered in the device memory consistent with integrated circuit anomaly.The device was cut open and a new battery was connected, device product code was reloaded and no anomaly was noted.Longevity assessment was performed, and device has exceeded the total projected longevity and is considered normal battery depletion.
|
|
Correction: h6.Investigation findings should have been ¿4214, erroneous data transfer¿ instead of ¿114, operational problem identified¿.H6, component code should have been ¿4707, computer software¿ instead of ¿472, ic (integrated circuit) chip¿.H11.Manufacturer narrative data should have been 'the event of unexpected mode switch was confirmed.The device was received in bvvi mode with battery voltage at end of life (eol).Battery trend data derived from the device image indicated that the monthly average battery voltage remained consistently high throughout the implant duration, despite a progressive increase in measured battery impedance.The persistently elevated voltage readings are inconsistent with the impedance trend and are indicative of corrupted, uncalibrated battery voltage measurements.At the time of receipt, the device was operating in backup mode secondary to a non-maskable interrupt (nmi) event.Physical analysis, including device de-capsulation, confirmed that the in-circuit battery voltage had reached end-of-life (eol) levels.The implant duration exceeded the projected longevity based on programmed field settings, which otherwise indicated normal battery depletion behavior.Subsequent functional testing performed with a new battery installed demonstrated normal device operation.'.
|