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Batch review performed on 29 may 2026 lot 2531150: (b)(4) manufactured and released on 12-dec-2025.Expiration date: 2030-nov-26.No anomalies found related to the problem.To date, 66 items of the same lot have been sold with no similar reported event during the period of review.Considering the semifinished lot (mat82418) of the device involved in this complaint, (b)(4) were manufactured and released 23-july-2025.To date, three similar events have been reported on the same semifinished lot during the period of review.Clinical evaluation performed by clinical affairs manager a k-wire d 2.5 x 200 mm fractured during use and a fragment remains inside the patient.The wire is currently stuck within the bone and cannot be removed.According to the surgeon, the patient`s bone quality was normal.Based on the available information and imaging, the retained fragment does not appear to interfere with the prosthesis.The pin remains embedded in the bone and no safe removal option has been identified.It should be noted that the evaluation is limited by the availability of a single radiographic image of poor resolution.As only one projection is available, it is not possible to clearly determine the exact position and orientation of the retained fragment.Therefore, the assessment relies on the information provided.The instrument is manufactured from surgical-grade stainless steel; however, it is not approved for long-term implantation.In rare cases, fragments of broken instruments may be left in the body.The occurrence of adverse reactions in such situations is extremely uncommon.Nevertheless, the surgeon must exercise their best clinical judgment in determining the appropriate course of action in the interest of the patient`s health.Root cause:although the specific circumstances cannot be confirmed, the conditions of surgical variation and intraoperative factors (e.G., bone quality, drilling angle, bending/redirection, axial or torsional forces, surgical handling) likely resulted in the applied forces exceeding the inherent limitations of the device resistance as constrained by the collective design inputs.The investigation does not indicate any potential manufacturing related issue or systemic deficiency.
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