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(b)(4).Date sent: 8/10/2026.D4 batch # a99j1u.Investigation summary:
the product was returned for evaluation.Visual inspection was conducted on the returned device.Visual analysis of the returned sample determined that the b5lt device was received with thermal damage at the sleeve tip, evidenced by melting and deformation of the component.In addition, the opened packaging was returned along with the instrument.Additionally, a photograph was provided showing the same condition observed on the received sample.The event reported was confirmed and it is related to improper use of the device.In order to prevent this kind of damage please avoid the contact with laser, electrosurgical or ultrasonic devices.As part of ees quality process all devices are manufactured, inspected, and released to approved specifications.A manufacturing record evaluation was performed for the finished device batch a99j1u number, and no non-conformances were identified.Manufacturing date 02/17/2026; expiration date 01/31/2031 for b5lt, lot 913d91.This entry records a complaint-related verification of sap date fields only.
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