| Catalog Number |
1CX*FX25E |
| Medical Device Problem Code |
Break (1069)
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| Health Effect - Clinical Code |
No Patient Involvement (2645)
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| Date of Event |
09/13/2016
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Type of Reportable Event
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Malfunction
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Additional Manufacturer Narrative
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The actual device has not been returned to the manufacturing facility for evaluation.For this reason, evaluation code 11 was used in the conclusions section of h6.A follow up report will be submitted within 30 days of this report being sent.A review of the device history record and the product release decision control sheet of the involved product/lot # combination was conducted with no relevant findings.A search of the complaint file did not find any other report with the involved product code/lot# combination.Terumo medical products (tmp) (importer) registration no.2243441 is submitting this report on behalf of ashitaka factory of terumo corporation (manufacturer) registration no.9681834.Exemption number e2015022.All available information has been placed on file in quality assurance for appropriate tracking, trending and follow-up.
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Event or Problem Description
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The user facility reported the temperature probe was found broken during setup.Follow up communication with the user facility confirmed the following information: the product was changed out; the surgery was completed successfully; and there was no patient involvement.
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Additional Manufacturer Narrative
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This report is being submitted as follow up # 1 to provide the returned sample evaluation results.The actual device was returned to the manufacturing facility for evaluation.Visual inspection confirmed the customer's observation.The thermistor probe on the oxygenator outlet port had been broken off.There were no other anomalies or defects on the remainder of the device.Magnifying inspection of the fracture cross-sections of the thermistor probe found no anomalies or defects which could have deteriorated the strength.Electron microscopic inspection of the fracture cross-sections revealed some smooth segments and a rough segment on the surface, with the generation of some streaks starting on the smooth surface and spread out to the rough segments.Simulation testing was conducted on a test sample.The test sample was exposed to a shock force on the thermistor probe.The thermistor probe broke off.Subsequent electron microscopic inspection of the fracture cross-section found that the segment on the side where the shock force had been applied was in the smooth state and that the opposite side was in the rough state with the generation of some streaks starting on the smooth surface going toward the rough surface.There was no generation of a deformity or dent on the surface of the thermistor probe.There is no evidence that this event was related to a device defect or malfunction.Although the exact cause cannot be definitively determined based on the investigation results, it is likely the thermistor probe of the actual sample was subjected to a shock force.The device labeling does address the potential for such an occurrence in the instruction for use (ifu) with the statement such as the following: (1) "do not use if the package or device is damaged (e.G.Cracked) or any of the port caps are off." all available information has been placed on file in quality assurance at the manufacturing facility for appropriate tracking, trending and follow-up.
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Search Alerts/Recalls
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