(b)(4).Batch # p92h5l.Device analysis: the analysis results found that the 2h12lp device was returned with no damage in the external components.In addition, the tyvek was returned along with the instrument.The universal seal latch onto the sleeve assembly.In addition the obturator latch onto the universal seal as well.No conclusion could be reached as to what may have caused the reported incident.The batch history record was reviewed and no defects, ncr¿s or protocols related to the complaint, were found during the manufacturing process.
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