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Date of event: unknown.The date received by manufacturer has been used for this field.Medical device expiration date: unknown.Device manufacture date: unknown.A device evaluation is anticipated, but has not yet begun.Upon completion of the investigation and/or device history review, a supplemental report will be filed.
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Investigation summary: as no pictures/samples are available the defect cannot be confirmed.As the lot is unknown, the device history record cannot be checked and due to the same reason, retained samples cannot be tested.In order to guarantee the properly function of phaseal devices, instructions explained in the ifu must be carefully followed.The root cause cannot be established upon information received.Leakage-other the customer complaints about leak and flow issues with c45 connector.No pictures or samples are available.There is no information about the lot number.Inspections and tests in manufacturing area: these are the inspections performed during manufacturing process for connector c45: during molding process: visual inspections for connectors are performed by the operator to avoid faulty parts (flashes, unfilled and burned parts, etc) according to ph-300 (current version).Critical to quality dimensions of all connector components are measured to check if the dimensions are within tolerance (ph-300).Luer cone and luer thread diameter are checked every 8 hours and at the beginning of the lot and after a machine stop.Go / no go gauge.Tip luer cone diameter is verified at the beginning of the lot and after a machine stop with a caliber.Assembly process: according to ph-303 it is checked the correct welding and position of the membrane, the absence of dirt and the well assembly of the cap.The correct welding of the membrane is doing according to pc-234 (current version).Finally, leakage test is performed in the quality lab to ensure the quality and functionality of the membrane according to pc-226 (current version).Conclusion: as no pictures/samples are available the defect cannot be confirmed.As the lot is unknown, the device history record cannot be checked and due to the same reason, retained samples cannot be tested.
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